
Technical Advisor
He has applied his expertise in pattern recognition and developed many threat detection algorithms for checked baggage screening and check-point screening. He was intimately involved at Analogic Corporation in the successful TSA certification of three (3) EDS scanners for checked baggage screening.
He invented practical methods in reducing dual energy CT technology to practice, allowing Analogic’s first dual energy volumetric CT scanner to be certified at “improved detection and reduced false alarm rates” commented by Clifford Wilke, CTO of TSA at Congressional hearing in 2005.
He developed advanced visualization and display technologies for security applications, and was awarded a research grant from the Science and Technology Directorate of Department of Homeland Security –“Evaluation of Screener Performance with 3D Display Systems for Security Technologies”. He was the Principal Investigator of the project.
Dr. Ying’s education includes B.S. in electric power engineering and M.S. in telecommunications and electronic systems from Shanghai Jiaotong University, and Ph. D. degree in Electrical Engineering from Boston University.

Dr. Ying has applied his expertise in pattern recognition and developed many threat detection algorithms for checked baggage screening and check-point screening. He was intimately involved at Analogic Corporation in the successful TSA certification of three (3) EDS scanners for checked baggage screening.